DME - Your Specialist for Scanning Probe Microscopy
Product Range
Atomic Force Microscopes (AFM) |
The BRR Microscope NEW! |
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AFM Systems for industrial and scientific applications
DME probe scanners offer highest possible flexibility and a large variety of configuration possibilities
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Combined Scanning Electron and Scanning Probe Microscope
This worldwide unique system combines all advantages of both instruments: Exactly find your place of interest,
investigate and manipulate it with any standard AFM cantilever you like, dramatically improve your
SEM resolution to single atomic level.
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Ultra high vacuum microscopes |
Special constructions |
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AFM and STM systems for ultra high vacuum applications
The DME scanning probe microscopes for ultra high vacuum are designed for single atomic resolution in all
three dimensions with highest possible stability
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Scanning Probe Microscopes for special applications
Buy the whole knowledge of more than 20 years of scanning probe microscopes: Together with you we build up
the right measurement setup for your special application. Examples from the past have been
electrochemical STMs, high temperature closed atmosphere AFMs for operation up to 800°C, optical nearfield
microscope setups of various kinds and much more.
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DME News
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DME - Danish Micro Engineering A/S has been manufacturer of scanning probe microscopes for more than 22 years.
Read more about DME's history here.