UHV microscopes and special contructions

We develop a suitable microscope for you for each special application!

Scanning Probe Microscopes for Ultra High Vacuum

Highest precision UHV Scanning Tunneling Microscope is designed for 3-dimensional single atomic resolution and has the following properties:

UHV AFM

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Highest Performance:
  • lowest noise
  • all modes available
  • The system can be baked out at a temperature up to 120°C
Ease of use:
  • the scanner including all necessary connections is mounted on a single UHV flange
  • plug and play cantilever exchange
Flexibility:
  • Rasterscope™ sample scanner setup with 9 µm scan range
  • sample size up to 5 mm
Versatility:
  • customer specified modifications
Further information:

UHV Scanning Tunneling Microscope

The DME Scanning Tunneling Microscope for Ultra High Vacuum is designed for 3-dimensional single atomic resolution and has the following properties:

UHV STM

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Technical questions?

Please call us: +49 700 1811 0700
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Highest Performance:
  • lowest noise
  • all modes available
Ease of use:
  • the scanner including all necessary connections is mounted on a single UHV flange
  • plug and play cantilever exchange
Flexibility:
  • Rasterscope™ sample scanner setup with 5 µm scan range
  • sample size up to 4.5 mm
Versatility:
  • available in two separate versions as room temperature or variable temperature scanner
  • customer specified modifications
Further information:

STM for electrochemical measurements

The Rasterscope™ ElectroChemical Scanning Tunneling Miscroscope (EC-STM) is dedicated for electrochemial investigation of surfaces in a liquid enviroment.

DME EC-STM

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Technical questions?

Please call us: +49 700 1811 0700
Or write us:

Your email address:

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Highest Performance:
  • lowest noise
  • diffenrent modes available
Ease of use:
  • plug and play cantilever exchange
Flexibility:
  • DME Rasterscope™ STM scanner setup with 4.5 µm scan range
  • sample size up to 5 mm
Versatility:
  • customer specified modifications
  • possible application: battery development, corrosion studies, electroplating, materials science
Further information:

DXSTM – head-to-head STM
Doubletip

Using a head-to-head STM you can access the same point on both surfaces of a thin membrane simultaneously. This allows for example a direct measurement of a controlled deformation induced by one STM probe and monitored by the other STM.

First results on a few-layer graphene membrane can be read in the article Probing from Both Sides: Reshaping the Graphene Landscape via Face-to-Face Dual-Probe Microscopy by Jannik C. Meyer et al. (Department of Physics, University of Vienna) published in Nanoletters.

UHV Tip Enhanced Raman Spectroscopy System

This system is a special version of a UHV Scanning Tunnelling Microscope allowing conducting tip enhanced raman spectroscopy (TERS) measurements.

UHV Tip Enhanced Raman Spectroscopy System

I.e. by nature, the signal to noise ratio in a Tip Enhanced Raman Spectroscopy (TERS) measurement is by nature very low, even though the tip amplifies the Raman signal by many orders of magnitude. This is due to the high lateral resolution and the low intensity of a Raman emission. To keep integration times for the optical measurement low, the optical system must have a numerical aperture as high as possible. Prinzip RAMAN-Setup The sketch on the right shows a setup with a numerical aperture of nearly 1. Almost the whole half sphere above the sample is used as light path.

Such a system working in ultra high vaccum was designed by us in close cooperation with the Department of Physical Chemistry of the Fritz-Haber-Institut in Berlin, Germany (former director was Prof. G. Ertl). The system has following the properties:

With few modifications this system can also be equipped with a shear force AFM scanner, so that also non-conductive samples can be examined.

SNOMs - Scanning Nearfield Optical Microscopy
SNOM

The tip scanner DS 95 is shear-force-microscope scanner, where the tip oscillates parallel to the sample surface. Instead of a cantilever, this scanner uses the sharpened end of an optical fiber as a scanning tip, which allows optical excitation and detection below the physical diffraction limit.

Depending on the type of SNOM experiment, many different measurement setups are possible, which can be realized by our manufactures.

The SNOM measurements done by the Institut für Angewandte Physik, Technische Universität Braunschweig show some examples of optical nearfield microscopy.

CAHT - Controlled Atmosphere High Temperature AFM
CAHT

The controlled atmosphere high temperature AFM (CAHT) has been developed in order to perform electrochemical measurements on solid oxide fuel cells and electrolyzer cells, which can be used for electrochemical power conversion of gaseous fuel to electricity. The operation temperature of solid oxid fuel cells and electrolyzer is about 800°C at high surface temperatures.

The CAHT-SPM consists of two main parts: the upper detector part (metal) and the lower scanner part (black). The detector part is the cold part of the microscope, where all functions connected with the operation of the SPM probe are performed. The scanner part is the hot part, where samples can be heated up to 800°C.

A detailed description an some measurement results can be read in the articles "Controlled Atmosphere High Temperature SPM for electrochemical measurements" published in the Journal of Physics and "Improved controlled atmosphere high temperature scanning probe microscope" published in the Review of Scientific Instrument.