Scanning Probe Microscopes for Ultra High Vacuum
The DME SCanning Probe Microscopes for Ultra High Vacuum are designed for threedimensional single atomic resolution.
Due to a mechanical loop of one to a few cm these instruments provide insuperable stability for perfect single atomic resolution
images (see also
"Stability of a Scanner Stage").
Our UHV microscopes also have the following properties:
- Damped, free hanging scan unit for mechanical isolation from vacuum chamber
- For easy handling, the scanner including all necessary connections are mounted on a single UHV flange
- Tip and sample exchange facilities are adopted to existing solutions on existing chambers
- Bake out temperature 120°C
We supply the following UHV systems:
 |
- Highest precision UHV Scanning Tunneling Microscope (STM)with 4.5 μm x 4.5 μm x 1 μm scan range
- Tip scanner (tip is moving and sample is fixed)
- Available in two separate versions as room temperature or variable temperature scanner
- Sample size up to 5 x 5 mm
Details...
|
 |
- Highest precision AFM/STM for UHV with 9 μm x 9 μm x 1 μm scan range
- Unique system: Supports usage of arbitrary standard AFM cantilevers by laser / quadrature detector layout
- Built-in optical microscope for rough positioning
- Piezomotor driven sample X/Y positioner supports 2 mm x 2 mm movement range
- Sample scanner layout (tip is fixed, the sample is moving)
- Sample size up to 5 mm x 5 mm
- Easy laser-/ and detector adjustment by DME's remote controlled 2D piezo mirror movers
- 4 electrical user feedthrougths for sample side
- 3 electrical user feedthroughts for cantilever side (4th feedthrough predefined for AC mode shaker piezo)
- Supports nearly all AFM operation modes
Details...
|
Back to overview page
