AFM Scanners of the DualScope DS 95 Series
The scanners of the DualScope DS 95 series are available in a number of different variants. The DS 95-50 scanner has a standard scan range of 50 µm x 50 µm x 5 µm, and the DS 95-200 scanner has a standard scan range of 200 µm x 200 µm x 15 µm. The DS 95-50 scanner can also be delivered with a larger Z scan range of 15 µm. The AFM scanners work in AC and DC mode (contact and non-contact mode) as well as support the measurement of the lateral torsion of the cantilever (Lateral Force mode). Irrespective of the scan range, all scanners have atomic resolution in the Z direction.
In the DS95 scanners, the laser unit is moved with the scanner during scanning, i.e. the laser point will not move at the back of the cantilever during scanning. Thus disturbances in the reflection layer on the cantilever do not influence the AFM image.
All scanners have a built-in linearization sensor in order to eliminate the influence of hysteresis in the Z piezo. Thereby, large differences in the height of the sample surface will be measured correctly, even if the scanner has only been calibrated with small differences in height, and vice versa. To allow measurements also in liquids, the scanner is equipped with a rubber membrane at the bottom, protecting the electronics from moisture entering the housing. So these scanners can also work in liquids such as water or alcohol.
The built-in optics in these scanners is similar to that of a 95 mm microscope objective. In contradistinction to the DualScope DS 45-40 model, the focal plane is independent of the cantilever position and lies app. 1 mm below the scanner front. Thus it is especially easy to find a certain position on the sample surface.
Furthermore, all scanners are available as E-models (shown in picture above). Apart from the basic AFM features, the E-models support the following functions:
- Possibility of connecting an external instruments for electrical measurements such as e.g. Kelvin Probe Force or resistance / capacitance measurements) and recording the data e.g. through the external input of the controller.
- Operation in STM mode
- Integrated tunnel current amplifier for measurement of small currents (max. 10 nA, 16 Bit resolution = 0,3 pA) for STM or conductive AFM measurements
- Bias voltage generator for STM operation or lithography
extremely easy...
A special feature of the DualScope DS 95 series is the automatic cantilever and laser adjustment. With the aid of the tools delivered with the scanner, a cantilever change can be made in less than a minute - also by a beginner, and without risk of damaging the cantilever during the change. To make possible this easy cantilever change, we deliver the cantilevers pre-mounted on a holder which by means of a dedicated tool can be inserted into the scanner where it is held in place magnetically.
If special cantilevers are needed, we also mount customer specified cantilevers. As an alternative, the customer can mount their own cantilevers by means of our easy to use cantilever mounting tool. In principle, this is a 5 axis manipulator with laser and detector unit. A data sheet of the cantilever mounting tool is available here.
In very few special cases, e.g. for MFM measurements, the magnetic cantilever holding may disturb the measurements. For such cases, we can deliver our scanner modified with a mechanical cantilever holding mechanism.
Further information is available in our Data sheet.