Scanners

Below is a list of our standard scanners. The AFM scanners of the DualScope DS 45 and DS 95 Series have a built-in microscope objective with a view to the cantilever and the surface of the investigated sample. So it is no problem to locate the interesting positions on a sample. The scanners can either be mounted in the nose piece of an optical microscope, or in one of our scanner stages. All scanners are Probe scanners, i.e. during scanning, the cantilever is moved from side to side over the sample, therefore no special scanner platform is necessary to operate the scanner. Anyway, we recommend the use of one of our stages instead of mounting the scanner in an optical microscope, since our stages will provide the right stability for this kind of system and include a CCD camera with monitor. Upon request, we can modify the scanners for sample scanning, i.e. with a scanning sample table, when this is needed for e.g. other scan planes or a special X-Y-positioning.

For coarse approach, all our scanners use our specially developed piezo motors. They provide ultra soft tip approach without stressing the sample surface. The piezo motors have an average movement of app. 1.5 mm and a positioning accuracy better than 0,1 nm. Thus, the Z range of the scanner is used optimally, since after the approach, the sample surface will be exactly in the middle of the Z range of the scanner. A further adjustment is automatically done between scans.

For stability purposes, the dedicated STM scanners are built into their own scanner stages, thus guaranteeing the highest resolution and least vibrations.

DualScope DS 45-40 AFM

Our small AFM scanner with a scan area of 40 x 40 micron. This scanner is also available as a SNOM scanner which can use metal or glass fibers.

DualScope DS 95-50/200 AFM

Our comfortable AFM scanners with scan ranges of 50 x 50 micron and 200 x 200 micron, respectively, and Z> ranges of up to 15 micron. The fully automatic cantilever adjustment makes routine scanning very easy. Available with additional functions for electrical measurements and STM mode.

Rasterscope EC STM

Our dedicated air STM scanner with integrated stage. Also available in a version for electrochemical STM measurements. The scanner has a scan range of 4,5 x 4,5 micron.

Rasterscope UHV STM

Our dedicated UHV STM scanner, available in various configurations and individually adaptable to existing UHV systems.