You are interested in Scanning Probe Microscopes?
Then this is the right place! Since 1989 we have been developing, manufacturing, and selling Scanning Probe Microscopes (SPM).
We can supply:
- Atomic Force Microscopes (AFM)
- Scanning Tunneling Microscopes (STM)
- Scanning Nearfield Optical Microscopes (SNOM)
- Combination instruments with various scanner types
- Customized solutions
Our goal: Create an AFM with a usability like a conventional light microscope
Using a light microscope is very easy: Put down a sample, do some focussing and in most cases you will see someting. It is not necessarily harder to do that with an AFM: Best examples are our DS 95 scanner series.
The integrated optical microscope and the connected CCD camera lets you easily find the interesting position on a sample. Then press the "Start" button; the rest is done by the AFM: With our selfmade piezo motor the cantilever smoothly approaches the surface and remains exactly in the Z axis middle position, so that the full Z range is available for scanning. Shortly after, the first image is ready and the controller continues by scanning the second image. The AFM automatically adjusts its Z-amplification according to the roughness of the sample. By this procedure it is possible to resolve atomic steps on the surface even with the scanner having the largest scan size of 200 x 200 x 15 µm.
And when the cantilever becomes dirty? No problem, exchanging the cantilever is even more simple than changing a microscope objective. This has been made possible by our perfect combination of mechanics, electronics and software.
Our AFMs work in any position and belong to the most compact instruments available on the marked. This also results in a very high stability. With our Iglu stage you can easily resolve atomic steps on nearly any writing table without additional active or passive vibration damping equipment. For good reason our instruments are integrated into many different companie's products.
Although most of our instruments is automatically controlled, you can have, if you like it, access to all parameters. Our scanners support nearly all measurement modes as well as AFM/STM lithography and diverse spectroscopy functions. Additionaly, there are a kind of macro language for process automatization, free copiing of our scan software, full data exchange with ImageMetrologie's SPM evaluation program SPIP, free laboratory control and scan software for Linux, long-term maintenance by backward compatibility of future controllers, etc...
Also regarding our other scanner types, i.e. STM and SNOM scanners, we attach great importance to ease of use. DME STM scanners belong to the best proven and established scanning probe microscopes at all, see the history of DME. the history of DME.
For your more complex problems our team of developers will assist you in finding the right solution and if you like we will develop exactly the right instrument for you. Just try it!
Let us demonstrate the power of our instruments. If it is at all possible, we like to do a demonstration at your place! Please use our contact page and we will find the closest dealer next to you. Or send us an email viainfo@Dme-ScanningProbeMicroscopes.com
DME - Specialists in Scanning Probe Microscope Technology
DME's key points are :
Usability
- Our instruments are characterized by the simplest possible operation combined with the capability for a high throughput. When it comes to new developments, we take great care to secure that the instruments will not "feel" like a prototype afterwards. Naturally, also new developments are supported by a corresponding software. Take cantilever change as an example: For our DS 95-AFM exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners has a built-in optics which facilitates the location of a specific place on the sample surface. Both guarantee effcient work and a high throughput.
We manufacture all main parts ourselves
- Our instruments are characterized by an optimal combination of mechanics, electronics and software. Only by in-depth harmonization of all three components a good scanning probe microscope can be obtained. Our developers work interdisciplinary: To make a good control software the developer must for example have also a deep understanding of mechanics and electronics. In the same manner the mechanical development process must consider how the electronics and software will later control the system. Actually, the real power of our team of developers lies in the interdiciplinary work and the permanent overview of the whole concept. All main parts of our Scanning Probe Microscopes are of our own manufacture; this includes the piezo motors for approach, the electronics, our software, and naturally our mechanical design. This has the advantage that we are able to quickly make modifcations in all parts of the instruments, should a certain application require such.
Flexibility
- All of our products are individually configured to meet the customer requirements. The application is always in the foreground, not the instrument. We have a series of Standard products that can be seen as a kind of starting point. If our product palette does not to 100 per cent cover the application, we will modify the instrument, and not the application. In a complex area like nanotechnology this is quite often needed, otherwise the performance will much lower than possible. Our experienced team can handle even the development of a fully new construction in accordance with the customers specifications. For special applications we are in close dialog with our customers to find out the best solution and also how to realize it in the shortest possible time frame.
Applications of Scanning Probe Microscopy
There are a many applications of scanning probe microscopy utilizing the precise distance regulation between tip and sample in order to position a tip in the optical nearfield of a sample. The advantage of the optical nearfield is the one can obtain optical information with a resolution smaller than the wavelength of the used light. Additionaly one can observe amplification effects used for example by tip enhanced raman spectroscopy (TERS).
In this context we developed in close collaboration with the Fritz-Haber-Institut in Berlin, Germany a UHV raman system providing an extraordinarily high numerical aperture:
With a Scanning Probe Microscope you can do much more than record images of surfaces. Here you can read something about optical nearfield microscopy (SNOM) and AFM lithography
- Further applications of Scanning Probe Microscopy
and in this connection, we also have a page with